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Akbar, Muhammad Ali and Haja Mohideen, Ahmad Jazlan and Mohd Ibrahim, Azhar and Ahmad, Arfah (2025) Deep learning-based yield prediction for the die bonding semiconductor manufacturing process. In: 7th International Conference on Electrical, Control and Computer Engineering (InECCE 2023), 22nd August 2023, Kuala Lumpur, Malaysia.
Ben Ameur, Mongi and Chebil, Jalel and Tahar, Jamel Bel Hadj and Habaebi, Mohamed Hadi and Zormati, Hanene (2025) Path loss prediction for V2I communications systems: a performance analysis of propagation models. In: 2024 International Microwave and Antenna Symposium (IMAS), 21-24 October 2024, Marrakech, Morocco.