Synthesis and characterization of ZnO thin film memristor

Mohd Yusoff, Marmeezee and Ani, Mohd Hanafi and -, Suryanto (2013) Synthesis and characterization of ZnO thin film memristor. Advanced Materials Research, 701. pp. 172-175. ISSN 1022-6680

	PDF - Published Version Restricted to Registered users only Download (637kB) | Request a copy
	PDF (SCOPUS) - Supplemental Material Restricted to Repository staff only Download (69kB) | Request a copy

Abstract

ZnO films were deposited on Cu substrate using electrodeposition and thermal oxidation method. The effect of deposited thin film thickness varied with deposition time was discussed. Synthesized ZnO films were characterized using XRD, FE-SEM and electrical measurement. The results from electrical measurement showed the deposited ZnO exhibits pinched hysteresis I–V curves. The synthesized ZnO shows a potential applications and options in production of a noncomplex and low cost memristor.

Item Type:	Article (Journal)
Additional Information:	4583/29620
Uncontrolled Keywords:	Thin films, Memrisor, Zinc oxide, Electrodeposition, Characterization
Subjects:	T Technology > TA Engineering (General). Civil engineering (General)
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button):	Kulliyyah of Engineering > Department of Manufacturing and Materials Engineering
Depositing User:	Dr Mohd Hanafi Ani
Date Deposited:	19 Apr 2013 12:02
Last Modified:	18 Aug 2017 16:15
URI:	http://irep.iium.edu.my/id/eprint/29620

Actions (login required)

View Item