Abd Rahman, Faridah and Roslizan, Iszan Uwais Amer and Gunawan, Teddy Surya and Fitriawan, Helmy and Kartiwi, Mira and Habaebi, Mohamed Hadi (2024) EEG-based fatigue detection using binary pattern analysis and KNN algorithm. In: 2024 IEEE 10th International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA), 30-31 July 2024, Bandung, Indonesia.
PDF
- Published Version
Restricted to Registered users only Download (1MB) | Request a copy |
||
|
PDF
- Supplemental Material
Download (158kB) | Preview |
Abstract
Fatigue is a prevalent issue that disrupts the overall well-being of individuals, leading to impaired cognitive functions such as learning, thinking, reasoning, remembering, and problem-solving. Chronic fatigue significantly increases the risk of accidents due to reduced focus, vigilance, and delayed reaction times. Traditional self-assessment methods for detecting fatigue are subjective and often unreliable. Recent advancements in neuroimaging have demonstrated that EEG signal analysis can objectively classify an individual's mental state. This research aims to develop a reliable and accurate EEG signal fatigue detection system. The EEG signals are decomposed into four levels using a one-dimensional discrete wavelet transform (1D-DWT). Textural features are extracted using binary pattern (BP) analysis and combined with seven statistical features. Then, these features are fed into a k-nearest neighbors (KNN) classifier to distinguish between the rest and fatigue states. Utilizing a dataset from the Mendeley Data website, the proposed system achieved an accuracy of 93.75%, precision between 93% and 95%, recall ranging from 92% to 95%, and an F1-score of 93% to 94%. This study highlights the potential of EEG-based systems to provide objective and accurate assessments of fatigue levels, thereby reducing the risks associated with chronic fatigue in daily life.
Item Type: | Proceeding Paper (Invited Papers) |
---|---|
Uncontrolled Keywords: | fatigue detection, binary pattern analysis, electroencephalogram (EEG), wavelet transform, k-nearest neighbors |
Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800 Electronics. Computer engineering. Computer hardware. Photoelectronic devices > TK7885 Computer engineering |
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button): | Kulliyyah of Engineering > Department of Electrical and Computer Engineering Kulliyyah of Engineering |
Depositing User: | Prof. Dr. Teddy Surya Gunawan |
Date Deposited: | 18 Nov 2024 11:19 |
Last Modified: | 18 Nov 2024 11:19 |
URI: | http://irep.iium.edu.my/id/eprint/115854 |
Actions (login required)
View Item |