IIUM Repository

Dr. Nur Idayu Ayob

Department of Manufacturing and Materials Engineering

Kuliyyah of Engineering, IIUM

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Latest Additions

  1. Zamzuri, Ahmad Syahmi and Ayob, Nur Idayu and Abdullah, Yusof and Hasbullah, Nurul Fadzlin (2020) Effect of irradiation upon single layer graphene on SiO2/Si substrate using electron beam irradiation (EBI). In: 4th Advanced Materials Conference 2018, 27-28 Nov 2018, Kuching, Malaysia.
  2. Ayob, Nur Idayu and Inagaki, Takeshi J. and Daimon, Hiroshi and Takeda, Sakura Nishino (2021) Empirical potential profile model for subbands with unusual energy separation in Si(111) p-type inversion layer. Japanese Journal of Applied Physics, 60. ISSN 0021-4922 E-ISSN 1347-4065
  3. Zamzuri, Ahmad Syahmi and Ayob, Nur Idayu and Abdullah, Yusof and Hasbullah, Nurul Fadzlin (2020) Effect of irradiation upon single layer graphene on SiO2/Si substrate using electron beam irradiation (EBI). In: 4th Advanced Materials Conference 2018 (AMC 2018), 27th-28th November 2018, Kuching, Sarawak.
  4. Zamzuri, Ahmad Syahmi and Ayob, Nur Idayu and Abdullah, Yusof and Saidin, Nur Ubaidah and Che Hak, Cik Rohaida (2020) Electrical behavior of Graphene/SiO2/Silicon material irradiated by electron for Field Effect Transistor (FET) applications. Materials Science Forum, 1010. pp. 339-345. ISSN 1662-9752
  5. Zamzuri, Ahmad Syahmi and Ayob, Nur Idayu and Abdullah, Yusof and Hasbullah, Nurul Fadzlin (2018) Effect of irradiation upon single layer graphene on SiO 2 /Si substrate using Electron Beam Irradiation (EBI). In: 4th Advanced Materials Conference (AMC) 2018, 27th-28th Nov. 2018, Hilton Kuching, Sarawak. (Unpublished)
  6. Ayob, Nur Idayu and Takeda, Sakura Nishino and Sakata, Tomohiro and Yoshikawa, Masaaki and Morita, Makoto and Daimon, Hiroshi (2015) Unusual energy separation of subbands in Si(111) p-channels induced by In adsorption. Japanese Journal of Applied Physics, 54 (6). 065702-1-065702-7. ISSN 0021-4922 E-ISSN 1347-4065
  7. Sakata, Tomohiro and Takeda, Sakura Nishino. and Ayob, Nur Idayu and Daimon, Hiroshi (2015) Effect of the flash annealing on the impurity distribution and the electronic structure in the inversion layer. e-Journal of Surface Science and Nanotechnology, 13. pp. 75-78. ISSN 1348-0391