Analysis of non-invasive fingerprint thickness based authentication method utilizing near infrared spectroscopy

Sulaiman, Nadzril and Tajul Ariffin, Qamarul Aiman (2022) Analysis of non-invasive fingerprint thickness based authentication method utilizing near infrared spectroscopy. In: Third International Conference on Emerging Electrical Energy, Electronics and Computing Technologies 2021, 14-15 December 2021, Virtual.

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Abstract

Fingerprints are a popular method of biometric based authentication. However, methods currently in use are susceptible to being bypass through the use of forgeries of the fingerprint pattern. Measuring the epidermal thickness of the fingerprint is a solution to the issue, as there are no current ways for a third-party to precisely replicate the thickness measurements. Near-Infrared Diffused Reflectance (NIR-DR) spectroscopy is the proposed method of measuring fingerprint thickness. Reflectance reading is taken at 5 specific wavelength points to generate a simplified plot for comparison. Thickness measurement is gauged by calculating change in reflectance percentage between the 800-900nm range. Data gathered showed variation in the reflectance spectra that was unique to each subject. Application for a fingerprint thickness-based authentication method is plausible but require additional research with a larger population sample and looking into the effects of age and skin colour for their effect on epidermal thickness.

Item Type:	Conference or Workshop Item (Plenary Papers)
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800 Electronics. Computer engineering. Computer hardware. Photoelectronic devices
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button):	Kulliyyah of Engineering Kulliyyah of Engineering > Department of Mechatronics Engineering
Depositing User:	Nadzril Sulaiman
Date Deposited:	17 Aug 2022 14:04
Last Modified:	17 Aug 2022 14:34
URI:	http://irep.iium.edu.my/id/eprint/99462

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