Signal integrity analysis and noise source extraction of integrated circuits using IBIS models

Baba, Tamana and Che Mustapha, Nurul Arfah and Hasbullah, Nurul Fadzlin (2021) Signal integrity analysis and noise source extraction of integrated circuits using IBIS models. In: 13th IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2021, Virtual, Kuala Lumpur.

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Abstract

Integrated Circuits (ICs) play a critical role in an electronic system's Electromagnetic Compatibility (EMC). Generally, ICs are the ultimate source of interference-causing signals and noise. Signal Integrity in ICs also poses increasing challenges to PCB designers. Analyzing the Signal Integrity issues at the upfront design level before the prototype board is fabricated is important. Electromagnetic Compatibility (EMC) improves significantly for a board that undergoes Signal Integrity analysis. The use of electronic equipment in the Automotive Industry has been increasing ever since. On an average a smart car contains over 50 ICs. This scenario creates a demand for EMC compliance of ICs used in Automotive Industry. Failure to make the ICs Electromagnetic Compatible could result in fatal accidents. This paper introduces the basic concepts of EMC of IC’s. A methodology to perform the Signal Integrity analysis and extract noise sources from the ICs using IBIS models has been presented. Co-simulations are carried out between ANSYS HFSS and Agilent ADS.

Item Type:	Conference or Workshop Item (Plenary Papers)
Uncontrolled Keywords:	Integrated circuits (ICs), Electromagnetic Interference (EMI), Electromagnetic Compatibility (EMC), IBIS model, Signal Integrity, Conducted Emissions.
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800 Electronics. Computer engineering. Computer hardware. Photoelectronic devices T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800 Electronics. Computer engineering. Computer hardware. Photoelectronic devices > TK7885 Computer engineering
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button):	Kulliyyah of Engineering > Department of Electrical and Computer Engineering
Depositing User:	Dr Nurul Arfah Che Mustapha
Date Deposited:	24 Dec 2021 08:56
Last Modified:	24 Dec 2021 08:56
URI:	http://irep.iium.edu.my/id/eprint/95131

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