Noise sources extraction for conducted emission modeling of IC’s using IBIS models

Baba, Tamana and Che Mustapha, Nurul Arfah and Hasbullah, Nurul Fadzlin (2021) Noise sources extraction for conducted emission modeling of IC’s using IBIS models. In: 2021 8th International Conference on Computer and Communication Engineering (ICCCE), Kuala Lumpur, Malaysia.

	PDF Restricted to Registered users only Download (2MB) | Request a copy
Preview	PDF (SCOPUS) Download (212kB) | Preview

Abstract

The proper functioning of an Integrated Circuit (IC) in an impeding Electromagnetic environment has always been a major concern. Electromagnetic Interference (EMI) can cause an IC to malfunction or give erroneous results. This becomes even a bigger concern for IC’s that are used in automotive industry. Automotive industry in particular, the smart vehicle, is facing design challenges such as susceptibility towards Electromagnetic Interference (EMI). The growing numbers of IC’s on the electronic modules in smart automotive industry creates demand on Electromagnetic Compatibility (EMC) compliance. This EMC is driven by preventing Electromagnetic Interference (EMI) malfunctions within a vehicle. Failure to prevent this could result in fatal accidents. This paper introduces the basic concepts related to the Electromagnetic Compatibility (EMC) of integrated circuits (IC’s). An overview of methods to evaluate EMC of an IC’s has been provided and a methodology to extract noise sources using IBIS model of IC’s is introduced in this paper. Cosimulations are carried out between ANSYS HFSS and Agilent ADS. Noise sources for conducted emission modelling have been extracted.

Item Type:	Conference or Workshop Item (Plenary Papers)
Uncontrolled Keywords:	Integrated circuits, Electromagnetic compatibility, Electromagnetic interference, Signal integrity, IBIS models, Noise extraction.
Subjects:	T Technology > TA Engineering (General). Civil engineering (General) > TA174 Engineering design T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800 Electronics. Computer engineering. Computer hardware. Photoelectronic devices T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800 Electronics. Computer engineering. Computer hardware. Photoelectronic devices > TK7885 Computer engineering
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button):	Kulliyyah of Engineering > Department of Electrical and Computer Engineering
Depositing User:	Dr Nurul Arfah Che Mustapha
Date Deposited:	23 Dec 2021 15:16
Last Modified:	23 Dec 2021 15:16
URI:	http://irep.iium.edu.my/id/eprint/95127

Actions (login required)

View Item