Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate

Muhida, Riza and Sutjipto, Agus Geter Edy and Matsui, T. and Toyama, T. and Okamoto, H. (2006) Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate. In: 8th International Conference on Properties and Applications of Dielectric Materials, 26 - 30 June 2006, Bali, Indonesia.

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Abstract

Electrical properties of PECVD produced poly-Si photovoltaic layers on the various textured substrates showing the light trapping effect have been investigated using an AC-conductivity technique. From temperature dependence of electron (hole) conductivities using n-i-n (p-i-p) structures, the Fermi level of the poly-Si layer on the slightly textured substrates is found to locate at the center of the band gap and this material is 'truly' intrinsic. As RMS roughness of the textured substrate, q increases, the Fermi level becomes close to conduction band edge, and finally, the poly-Si layer on the highly textured substrate exhibits n-type character even though any deposition conditions for the poly-Si layers are not changed at all. Changes in electrical conductivities of the poly-Si thin films in conjunction with the results on photovoltaic performances and microstructure are also discussed.

Item Type:	Conference or Workshop Item (Full Paper)
Additional Information:	4763/9439
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK452 Electric apparatus and materials. Electric circuits. Electric networks
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button):	Kulliyyah of Engineering
Depositing User:	Dr Agus Geter Edy Sutjipto
Date Deposited:	04 Apr 2012 12:19
Last Modified:	04 Apr 2012 12:19
URI:	http://irep.iium.edu.my/id/eprint/9439

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