Optimum KOH wet etching of cantilever tip for better image captured by nanoeducator

Edy Sutjipto, Agus Geter and Faris, Waleed Fekry and Adesta, Erry Yulian Triblas and Hanim, Hafizah (2011) Optimum KOH wet etching of cantilever tip for better image captured by nanoeducator. Applied Mechanics and Materials, 84-85. pp. 392-395. ISSN 1660-9336

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Abstract

The development of the various scanning probe microscopy techniques has revolutionized the study of surface structure up to atomic scale. Among these techniques, Nanoeducator as scanning force microscope or SFM has been developed to allow the accomplishment of various measuring techniques both for scanning tunneling microscope (STM) and non-contact atomic force microscope (AFM). However, there is no exact guidance how to fabricate cantilever to gather the good image. In order to achieve the better cantilever for students, this paper emphasizes on tip’s processing by altering etching length parameter as tip plays an important role to achieve better quality image during scanning operation. This paper also provides a guide for undergraduate student to know better about this machine as well as the principle behind it for them to acquire better quality image for their works. It was found that the number of turning of tungsten and etching time could produce good tip of cantilever. It is recommended for lecturers, students and technician to consider about turning and time of etching to produce a better tip of cantilever in Nanoeducator.

Item Type:	Article (Journal)
Additional Information:	4703/8575
Uncontrolled Keywords:	Scanning probe microscope, scanning tunneling microscope, atomic force microscope, scanning force microscope, tip
Subjects:	T Technology > TA Engineering (General). Civil engineering (General) > TA401 Materials of engineering and construction
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button):	Kulliyyah of Engineering
Depositing User:	Dr Agus Geter Edy Sutjipto
Date Deposited:	09 Dec 2011 14:14
Last Modified:	09 Dec 2011 14:14
URI:	http://irep.iium.edu.my/id/eprint/8575

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