IIUM Repository

Gain investigation for commercial GaAs and SiGe HBT LNA's under electron irradiation

Youssouf, Abdouraouf S. and Habaebi, Mohamed Hadi and Ibrahim, S.Noorjannah and Hasbullah, Nurul Fadzlin (2017) Gain investigation for commercial GaAs and SiGe HBT LNA's under electron irradiation. In: 14th Student Conference on Research and Development, IEEE (SCOReD 2016), 13th-14th December 2016, Kuala Lumpur.

[img] PDF - Published Version
Restricted to Registered users only

Download (1MB) | Request a copy
[img] PDF (SCOPUS) - Published Version
Restricted to Registered users only

Download (148kB) | Request a copy
[img]
Preview
PDF (Title index in WOS) - Supplemental Material
Download (362kB) | Preview

Abstract

In this paper, a characterization and comparison between the effects of Electron irradiation on low noise amplifiers (LNAs) implemented in a Silicon-Germanium (SiGe) Heterojunction Bipolar Transistor (HBT) and Gallium-Arsenide (GaAs) HBT technologies, respectively, was carried out. Previous studies [1] have shown that the properties of SiGe and GaAs HBT's are very tolerant to gamma, neutron, and proton irradiation without additional radiation hardening. Nowadays, commercial on the shelves (COTS) LNAs have been used in CubeSat communication system lunched in Low and Medium Earth Orbits. It therefore believed that the electron radiation in space may degrade the LNA's performance and lead to its failure. This is shows the importance of such investigation in evaluating and comparing the performance of the GaAs and SiGe LNAs which represent an important module in the front end of the communication receiver system. Two samples of GaAs and SiGe have been selected: the ADL 5523 GaAs and the SiGe BFU730F LNAs which are respectively cover a frequency range of 400MHz to 4 GHz and 2.3 to 2.7 GHz. Samples were irradiated with 3 MeV Electron doses ranging from 50 kGy to 250 kGy in the Electron Beam Irradiation Centre (Alutron), Nuclear Malaysia Agency. Results measurement have been carry out in the RF Laboratory in the faculty of engineering (IIUM), using the vector network analyzer 50 GHz. The results indicate that both SiGe and GaAs HBT technologies have been affected by the electron Irradiation.

Item Type: Conference or Workshop Item (Plenary Papers)
Additional Information: 6727/54043
Uncontrolled Keywords: Investigation, Gain, Electron radiation, Low Noise Amplifier, Gallium Arsenide, Silicon Germanium
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK5101 Telecommunication. Including telegraphy, radio, radar, television
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button): Kulliyyah of Engineering > Department of Electrical and Computer Engineering
Depositing User: Dr. Mohamed Hadi Habaebi
Date Deposited: 19 Jan 2017 12:24
Last Modified: 21 Aug 2023 16:12
URI: http://irep.iium.edu.my/id/eprint/54043

Actions (login required)

View Item View Item

Downloads

Downloads per month over past year