CMOS Op amp testing for capacitive measuring systems application

Arfah, Nurul and Alam, A. H. M. Zahirul and Khan, Sheroz (2011) CMOS Op amp testing for capacitive measuring systems application. In: 2011 IEEE Regional Symposium on Micro and Nanoelectronics (RSM 2011), 28-30 September, Kota Kinabalu, Malaysia.

PDF (CMOS Op amp testing) - Published Version Restricted to Repository staff only Download (846kB) | Request a copy

Abstract

Operational amplifier (Op amp) is the most integral part of an embedded circuit building block. In this paper, the testing of an integrated Op amp suitable use for capacitance and high speed measuring system has been made. The Op amp testing (such as large signal differential transfer characteristic, frequency respond analysis, input common mode analysis, slew rate analysis) has been done using the PSpice OrCAD Version 16.0 circuit simulator and simulation results were compared with the design specification. The design of this Op amp for capacitive measuring system is making use of 0.13 μm complementary metal-oxide-semiconductor (CMOS) technology. This high speed and low power consumption system design is suitable use in a measuring system for detection a wide and lower range of capacitance.

Item Type:	Conference or Workshop Item (UNSPECIFIED)
Additional Information:	4575/11860
Uncontrolled Keywords:	CMOS Integrated Circuit , capacitance measuring systems , operational amplifier
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button):	Kulliyyah of Engineering Kulliyyah of Engineering > Department of Electrical and Computer Engineering
Depositing User:	Fuziah Arifin
Date Deposited:	13 Jan 2012 12:36
Last Modified:	14 Jan 2021 09:36
URI:	http://irep.iium.edu.my/id/eprint/11860

Actions (login required)

View Item