Muhida, Riza and Sutjipto, Agus Geter Edy and Matsui, T. and Toyama, T. and Okamoto, H. (2006) Measuring the electronic properties of poly-si thin film solar cells deposited on textured substrate. In: 8th International Conference on Properties and Applications of Dielectric Materials, 26 - 30 June 2006, Bali, Indonesia.
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Abstract
Electrical properties of PECVD produced poly-Si photovoltaic layers on the various textured substrates showing the light trapping effect have been investigated using an AC-conductivity technique. From temperature dependence of electron (hole) conductivities using n-i-n (p-i-p) structures, the Fermi level of the poly-Si layer on the slightly textured substrates is found to locate at the center of the band gap and this material is 'truly' intrinsic. As RMS roughness of the textured substrate, q increases, the Fermi level becomes close to conduction band edge, and finally, the poly-Si layer on the highly textured substrate exhibits n-type character even though any deposition conditions for the poly-Si layers are not changed at all. Changes in electrical conductivities of the poly-Si thin films in conjunction with the results on photovoltaic performances and microstructure are also discussed.
Item Type: | Conference or Workshop Item (Full Paper) |
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Additional Information: | 4763/9439 |
Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK452 Electric apparatus and materials. Electric circuits. Electric networks |
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button): | Kulliyyah of Engineering |
Depositing User: | Dr Agus Geter Edy Sutjipto |
Date Deposited: | 04 Apr 2012 12:19 |
Last Modified: | 04 Apr 2012 12:19 |
URI: | http://irep.iium.edu.my/id/eprint/9439 |
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