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High voltage discharge profile on soil breakdown using impulse discharge

Fajingbesi, Fawwaz Eniola and Midi, Nur Shahida and Elsheikh, Elsheikh Mohamed Ahmed and Yusoff, Siti Hajar (2017) High voltage discharge profile on soil breakdown using impulse discharge. In: The International Technical Postgraduate Conference (Tech-Post 2017), 5th-6th of April 2017, Kuala Lumpur.

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Grounding terminals are mandatory in electrical appliance design as they provide safety route during overvoltage faults. The soil (earth) been the universal ground is assumed to be at zero electric potential. However, due to properties like moisture, pH and available nutrients; the electric potential may fluctuate between positive and negative values that could be harmful for internally connected circuits on the grounding terminal. Fluctuations in soil properties may also lead to current crowding effect similar to those seen at the emitters of semiconductor transistors. In this work, soil samples are subjected to high impulse voltage discharge and the breakdown characteristics was profiled. The results from profiling discharge characteristics of soil in this work will contribute to the optimization of grounding protection system design in terms of electrode placement. This would also contribute to avoiding grounding electrode current crowding, ground potential rise fault and electromagnetic coupling faults.

Item Type: Conference or Workshop Item (Plenary Papers)
Additional Information: 7394/59373
Uncontrolled Keywords: breakdown characteristics, current crowding effect, discharge characteristics, electrical appliances, ground potential rise, grounding protection, high-voltage discharges, semiconductor transistors
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button): Kulliyyah of Engineering > Department of Electrical and Computer Engineering
Depositing User: Nur Shahida Midi
Date Deposited: 16 Nov 2017 15:58
Last Modified: 16 Nov 2017 15:58
URI: http://irep.iium.edu.my/id/eprint/59373

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