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Fast spiral-scan atomic force microscopy

Mahmood, Iskandar Al-Thani and Moheimani, S.O. Reza (2009) Fast spiral-scan atomic force microscopy. Nanotechnology, 20 (36). 365503-(4). ISSN 0957-4484

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In this paper, we describe a new scanning technique for fast atomic force microscopy. In this method, the sample is scanned in a spiral pattern instead of the well established raster pattern. A spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying amplitudes to the x -axis and y -axis of an atomic force microscope (AFM) scanner respectively. The use of the single tone input signals allows the scanner to move at high speeds without exciting the mechanical resonance of the device and with relatively small control efforts. Experimental results obtained by implementing this technique on a commercial AFM indicate that high-quality images can be generated at scan frequencies well beyond the raster scans.

Item Type: Article (Journal)
Additional Information: 3614/566
Uncontrolled Keywords: surfaces, interfaces and thin films, nanoscale sciences
Subjects: Q Science > QH Natural history
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button): Kulliyyah of Engineering > Department of Mechatronics Engineering
Depositing User: Dr. Iskandar Al-Thani bin Mahmood
Date Deposited: 14 Jul 2011 14:50
Last Modified: 14 Jul 2011 14:50
URI: http://irep.iium.edu.my/id/eprint/566

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