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A new scanning method for fast atomic force microscopy

Mahmood, Iskandar Al-Thani and Moheimani, S.O. Reza and Bhikkaji, Bharath (2011) A new scanning method for fast atomic force microscopy. IEEE Transactions on Nanotechnology, 10 (2). 203 -216. ISSN 1536-125X

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In recent years, the atomic force microscope (AFM) has become an important tool in nanotechnology research. It was first conceived to generate 3-D images of conducting as well as nonconducting surfaces with a high degree of accuracy. Presently, it is also being used in applications that involve manipulation of material surfaces at a nanoscale. In this paper, we describe a new scanning method for fast atomic force microscopy. In this technique, the sample is scanned in a spiral pattern instead of the well-established raster pattern. A constant angular velocity spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying amplitudes to the x-axis and y -axis of AFM nanopositioner, respectively. The use of single-frequency input signals allows the scanner to move at high speeds without exciting the mechanical resonance of the device. Alternatively, the frequency of the sinusoidal set points can be varied to maintain a constant linear velocity (CLV) while a spiral trajectory is being traced. Thus, producing a CLV spiral. These scan methods can be incorporated into most modern AFMs with minimal effort since they can be implemented in software using the existing hardware. Experimental results obtained by implementing the method on a commercial AFM indicate that high-quality images can be generated at scan frequencies well beyond the raster scans.

Item Type: Article (Journal)
Additional Information: 3614/559
Uncontrolled Keywords: 3D imaging;AFM nanopositioner;conducting surface;constant angular velocity;constant linear velocity;fast atomic force microscopy;high-quality imaging;mechanical resonance;nanotechnology research;nonconducting surface;scanning method;sine signals;single frequency cosine;single-frequency input signals;sinusoidal set points;spiral trajectory;surface material;well-established raster pattern;angular velocity;atomic force microscopy;nanotechnology;
Subjects: Q Science > QH Natural history
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button): Kulliyyah of Engineering > Department of Mechatronics Engineering
Depositing User: Dr. Iskandar Al-Thani bin Mahmood
Date Deposited: 14 Jul 2011 12:48
Last Modified: 28 Jul 2011 11:58
URI: http://irep.iium.edu.my/id/eprint/559

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