Spiral-scan atomic force microscopy: a constant linear velocity approach

Mahmood, Iskandar Al-Thani and Moheimani, S.O. Reza (2010) Spiral-scan atomic force microscopy: a constant linear velocity approach. In: 10th IEEE International Conference on Nanotechnology Joint Symposium with Nano Korea, 17 - 20 August 2010, KINTEX, Korea.

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Abstract

This paper describes an alternative method to the widely-used raster-scan technique for Atomic Force Microscopy (AFM). In this method, the sample is scanned in a spiral pattern instead of the well established raster trajectory. A spiral pattern is produced by applying cosine and sine signals with slowly varying amplitudes to the x-axis and y-axis of an AFM scanner respectively. In order to ensure that the spiral trajectory travels at a constant linear velocity (CLV), frequency and amplitude of the input signals are varied simultaneously in a way that the linear velocity of the scanner is kept constant. Experimental results obtained by implementing the CLV spiral scan on a commercial AFM indicate that, compared with the raster-scan method, high-quality AFM images of equal area and pitch can be generated two times faster and using half of the total traveled distance.

Item Type:	Conference or Workshop Item (Full Paper)
Additional Information:	3614/5303 (Proceedings of 10th IEEE International Conference on Nanotechnology Joint Symposium with Nano Korea, ISBN: 9781424470327)
Uncontrolled Keywords:	constant linear velocity; cosine signal; spiral pattern scanning; spiral scan atomic force microscopy; spiral trajectory; atomic force microscopy
Subjects:	Q Science > Q Science (General) T Technology > TJ Mechanical engineering and machinery > TJ212 Control engineering
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button):	Kulliyyah of Engineering > Department of Mechatronics Engineering
Depositing User:	Dr. Iskandar Al-Thani bin Mahmood
Date Deposited:	01 Nov 2011 09:19
Last Modified:	01 Nov 2011 09:19
URI:	http://irep.iium.edu.my/id/eprint/5303

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