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A modular system of deep level transient spectroscopy

Rusli, Nazreen and Debuf, Didier (2011) A modular system of deep level transient spectroscopy. In: 2011 IEEE International Conference on Computer Applications and Industrial Electronics (ICCAIE 2011), 4-7 Dec. 2011, Penang.

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Abstract

Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequency Deep Level Transient Spectroscopy (FFDLTS) is proposed as one of the methods to analyze the defect level depth.

Item Type: Conference or Workshop Item (Full Paper)
Additional Information: 5204/36427 (ISBN: 978-1-4577-2058-1, DOI: 10.1109/ICCAIE.2011.6162137)
Uncontrolled Keywords: DLTS; FFDLTS; LabVIEW; Defect
Subjects: Q Science > QC Physics
Kulliyyahs/Centres/Divisions/Institutes: Centre for Foundation Studies
Depositing User: Mrs Nazreen Rusli
Date Deposited: 22 Apr 2014 15:38
Last Modified: 25 Apr 2014 15:30
URI: http://irep.iium.edu.my/id/eprint/36427

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