Influence of magnetic field on reduction chatter and of surface roughness in end milling of Titanium Alloy - Ti-6Al-4V

Sulaiman, Syidatul Akma and Amin, A. K. M. Nurul and Arif, Muammer Din (2012) Influence of magnetic field on reduction chatter and of surface roughness in end milling of Titanium Alloy - Ti-6Al-4V. In: International Conference on Advances in Manufacturing and Materials Engineering (ICAMME’2012), 3 - 5 July 2012, Kuala Lumpur.

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Abstract

One of the most challenging issues in machining process is understanding the chatter phenomenon. Chatter mechanics is still not fully understood. It is inconsistent in character, making it difficult to analyze and predict. This research work investigates the influence of permanent magnets on chatter suppression in end milling of Titanium alloy (Ti-6Al-4V) using uncoated WCCo insert. The experiments were designed based on the Response Surface Methodology (RSM) approach using DESIGN EXPERT (DOE) software. The experiments were performed under two different conditions: under normal condition and under the application of magnetic fields from two permanent magnets located in opposite direction. Ti-6Al-4V was used as the work material. The resultant average surface roughness was found to be reduced by a maximum of 50% due to magnet application. Scanning Electron Microscope (SEM) was used to analyze the chip morphology. The microphotographs showed the evidence of more stable chip formation under the influence of magnetic fields.

Item Type:	Conference or Workshop Item (Full Paper)
Additional Information:	2872/26320
Uncontrolled Keywords:	Chatter, Permanent Magnet, Surface Roughness, Uncoated Tungsten Carbide
Subjects:	T Technology > TS Manufactures > TS200 Metal manufactures. Metalworking
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button):	Kulliyyah of Engineering > Department of Manufacturing and Materials Engineering
Depositing User:	Dr. A.K.M. Nurul Amin
Date Deposited:	18 Jul 2013 14:46
Last Modified:	18 Jul 2013 14:46
URI:	http://irep.iium.edu.my/id/eprint/26320

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