The use of scanning electron microscope in evaluating insulation property

Sutjipto, Agus Geter Edy and Afzeri, Afzeri and Muhida, Riza and Sopyan, Iis and Haruman, Esa (2011) The use of scanning electron microscope in evaluating insulation property. In: Mechatronics book series: Selected papers from ICOM'01, ICOM'05 and ICOM'08. IIUM Press, Kuala Lumpur, pp. 180-186. ISBN 9789670225685

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Item Type:	Book Chapter
Additional Information:	4703/17609
Uncontrolled Keywords:	gantry, crane, fuzzy, logic
Subjects:	T Technology > TA Engineering (General). Civil engineering (General)
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button):	Kulliyyah of Engineering
Depositing User:	Dr Agus Geter Edy Sutjipto
Date Deposited:	25 Jul 2012 09:10
Last Modified:	25 Jul 2012 14:12
URI:	http://irep.iium.edu.my/id/eprint/17609

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