Items where Author is "Yusop, N. S."
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Yusop, N. S. and Nordin, Anis Nurashikin and Khairi, M. Azim and Hasbullah, Nurul Fadzlin (2018) The impact of scaling on single event upset in 6T and 12T SRAMs from 130 to 22 nm CMOS technology. Radiation Effects and Defects in Solids, 173 (11-12). pp. 1090-1104. ISSN 1042-0150