IIUM Repository

Items where Author is "Kamaruddin , Mohd. Hanif"

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Item Type | No Grouping
Number of items: 2.


Izzudin , Ismah and Kamaruddin , Mohd. Hanif and Nordin, Anis Nurashikin and Soin, Norhayati (2012) Trench DMOS interface trap characterization by three-terminal charge pumping measurement. Microelectronics Reliability, 52 (12). pp. 2914-2919.

Conference or Workshop Item

Izuddin, Ismah and Kamaruddin, Mohd. Hanif and Nordin, Anis Nurashikin (2011) Modeling of the reliability baseline for process control monitoring kerf structures. In: 2011 IEEE Regional Symposium on Micro and Nanoelectronics (RSM), 28-30 September, Kota Kinabalu, Malaysia.

This list was generated on Sat Jun 6 22:25:49 2020 +08.