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Items where Author is "Jian, X."

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Article

Edwards, R.S. and Sophian, Ali and Dixon, S. and Tian, G.-Y. and Jian, X. (2006) Dual EMAT and PEC non-contact probe: applications to defect testing. NDT & E International , 39 (1). 45 - 52. ISSN 0963-8695

This list was generated on Fri Nov 24 08:10:05 2017 +08.