Items where Author is "Abdul Hadi, Dayanasari"
 | Up a level |
Group by: Item Type | No Grouping
Number of items: 1.
Hatta, Sharifah Wan M. and Hussin, Hanim Yati and Soon, F.Y. and Abdul Wahab, Yasmin and Abdul Hadi, Dayanasari and Soin, Norhayati and Alam, A. H.M.Zahirul and Nordin, Anis Nurashikin (2017) Negative bias temperature instability characterization and lifetime evaluations of submicron pMOSFET. In: 2017 IEEE Symposium on Computer Applications & Industrial Electronics (ISCAIE 2017), 24th-25th April 2017, Pulau Langkawi, Kedah.