Novel characterization technique by using an SEM

Sutjipto, Agus Geter Edy and -, Jufriadi and Muhida, Riza and Takata, Masasuke (2008) Novel characterization technique by using an SEM. In: XXIII-rd Int. Symp. on Discharges and Electrical Insulation in Vacuum (ISDEIV 2008), 15 - 19 September 2008, Bucharest, Romania.

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Abstract

Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron beam to charge an insulator without metallic coating and to produce a surface discharging (surface breakdown/flashover) but also to observe the visible charging and discharging on the sample surface. A model of electric field distribution on the surface was developed in order to explain charging and discharging phenomena. Since charging and discharging process involves incubation time, therefore this process can be used to characterize or evaluate the insulation property of materials under electron bombardment.

Item Type:	Conference or Workshop Item (Full Paper)
Additional Information:	4703/9393
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK452 Electric apparatus and materials. Electric circuits. Electric networks
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button):	Kulliyyah of Engineering > Department of Manufacturing and Materials Engineering
Depositing User:	Dr Agus Geter Edy Sutjipto
Date Deposited:	06 Apr 2012 15:18
Last Modified:	06 Apr 2012 15:18
URI:	http://irep.iium.edu.my/id/eprint/9393

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