Fuzzy based technique for microchip lead inspection using machine vision

Hawari, Yasser and Salami, Momoh Jimoh Emiyoka and Aburas, Abdurazzag Ali (2008) Fuzzy based technique for microchip lead inspection using machine vision. In: International Conference on Computer and Communication Engineering 2008, 13 -15 May 2008 , Kuala Lumpur, Malaysia.

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Abstract

This research develops a fuzzy based algorithm for microchip image lead Inspection. Leads are inspected for count, planarity, offset, pitch and span defects. Firstly, it utilizes fast preprocessing techniques and blobs’ features extraction methods to achieve high inspection rates. Using the features extracted, the algorithm first finds a proper thresholding value. It then applies Fuzzy logic to make a decision on the status of the IC based on these features. The algorithm proposes a structured way for building the fuzzy systems as well as the associated set of inference rules.

Item Type:	Conference or Workshop Item (Full Paper)
Additional Information:	2470/6952
Subjects:	T Technology > T Technology (General)
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button):	Kulliyyah of Engineering > Department of Mechatronics Engineering
Depositing User:	Prof Momoh-Jimoh Salami
Date Deposited:	09 Aug 2012 11:19
Last Modified:	09 Aug 2012 11:19
URI:	http://irep.iium.edu.my/id/eprint/6952

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