Randomness analysis of pseudo random noise generator using 24-bits LFSR

Yaacob, Siti Hazwani and Khan, Sheroz and Al-Khateeb, Khalid A. Saeed and Siddiqi, Mohammad Umar and Habaebi, Mohamed Hadi and Shahid, Zeeshan (2014) Randomness analysis of pseudo random noise generator using 24-bits LFSR. In: 2014 Fifth International Conference on Intelligent Systems, Modelling and Simulation (ISMS 2014), 27th-29th Jan. 2014, Langkawi, Kedah.

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Abstract

We have described in previous work the generation of PN-sequence by employing a 4-bit shifted Linear Feedback Shift Register (LFSR) for application into Direct Sequence Spread Spectrum (DSSS) system by simulation. In this paper, is proposed a pseudo random number generator (PRNG) circuit consisting of 24-bit shift registers (LFSR) which has much longer period to improve statistical properties. We simulated the LFSR circuit by using Multisim 11.0 and the pseudo random sequence generated is tested with statistical test of NIST Test suite. The sequence is passed the entire selected test and we concluded that our pseudo random sequence has long enough period to be considered as random. Keywords— Linear feedback shift register (LFSR), Pseudo random number generator (PRNG), pseudo random sequence, randomness tests, NIST SP800-22.

Item Type:	Conference or Workshop Item (Invited Papers)
Additional Information:	3930/41079 (ISBN: 978-1-4799-3857-5, ISSN: 2166-0662, DOI: 10.1109/ISMS.2014.141)
Uncontrolled Keywords:	Linear feedback shift register (LFSR), Pseudo random number generator (PRNG), pseudo random sequence, randomness tests, NIST SP800-22
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK5101 Telecommunication. Including telegraphy, radio, radar, television
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button):	Kulliyyah of Engineering > Department of Electrical and Computer Engineering
Depositing User:	Dr. Mohamed Hadi Habaebi
Date Deposited:	11 Feb 2015 09:50
Last Modified:	18 Sep 2017 17:31
URI:	http://irep.iium.edu.my/id/eprint/41079

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