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Understanding stress using EEG-VA approach

Abdul Rahman, Abdul Wahab and K. S, Rahnuma (2011) Understanding stress using EEG-VA approach. In: Understanding brain developmental disorder based on EEG in soft computing approach. IIUM Press, Kuala Lumpur, pp. 252-270. ISBN 9789674181116

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Item Type: Book Chapter
Additional Information: 6145/20409
Uncontrolled Keywords: Understanding stress, EEG-VA approach
Subjects: T Technology > T Technology (General)
Kulliyyahs/Centres/Divisions/Institutes (Can select more than one option. Press CONTROL button): Kulliyyah of Information and Communication Technology
Kulliyyah of Information and Communication Technology
Depositing User: Prof Abdul Wahab Abdul Rahman
Date Deposited: 14 Aug 2012 09:50
Last Modified: 30 Jun 2020 15:09
URI: http://irep.iium.edu.my/id/eprint/20409

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